Microscopy Primer
Light and Color
Microscope Basics
Special Techniques
Digital Imaging
Confocal Microscopy
Live-Cell Imaging
Photomicrography
Microscopy Museum
Virtual Microscopy
Fluorescence
Web Resources
License Info
Image Use
Custom Photos
Partners
Site Info
Contact Us
Publications
Home

The Galleries:

Photo Gallery
Silicon Zoo
Pharmaceuticals
Chip Shots
Phytochemicals
DNA Gallery
Microscapes
Vitamins
Amino Acids
Birthstones
Religion Collection
Pesticides
BeerShots
Cocktail Collection
Screen Savers
Win Wallpaper
Mac Wallpaper
Movie Gallery

Interactive Tutorials

Darkfield Condenser Adjustment

This tutorial allows the student to experiment with the adjustable parameters in condenser alignment and configuration for darkfield microscopy. Instructions about how to use the tutorial appear below the applet window.

The default settings for the tutorial are a perfectly aligned condenser under darkfield illumination. The Sample Fine Focus slider allows the visitor to adjust focus on the sample. Use the slider labeled Opaque Stop Size to toggle through a series of stops that range from 8 millimeters to 24 millimeters in diameter. The effect on substage darkfield Condenser Position is also controlled by a slider that demonstrates how the viewfield changes as the condenser is raised and lowered. A set of radio buttons allows the visitor to toggle a Bertrand lens in and out of the viewfield. X and Y Position sliders are used to center the darkfield stop in the rear focal plane of the objective using the Bertrand lens.

Contributing Authors

Mortimer Abramowitz - Olympus America, Inc., Two Corporate Center Drive., Melville, New York, 11747.

Matthew J. Parry-Hill and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.


BACK TO DARKFIELD MICROSCOPY

Questions or comments? Send us an email.
© 1998-2022 by Michael W. Davidson and The Florida State University. All Rights Reserved. No images, graphics, scripts, or applets may be reproduced or used in any manner without permission from the copyright holders. Use of this website means you agree to all of the Legal Terms and Conditions set forth by the owners.
This website is maintained by our
Graphics & Web Programming Team
in collaboration with Optical Microscopy at the
National High Magnetic Field Laboratory.
Last modification: Tuesday, Sep 11, 2018 at 10:55 AM
Access Count Since June 17, 1999: 33207
For more information on microscope manufacturers,
use the buttons below to navigate to their websites: