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Interactive Java Tutorials
Depth Of Focus
This tutorial explores how focus can be varied on thick samples to selectively bring different focal planes into view.
The tutorial simulates a differential interference contrast (DIC) microscope viewing samples either with or without a retardation plate. The retardation plate can be inserted by using the radio buttons at the bottom right of the microscope port. To operate the tutorial, use the pull-down menu bar to select a sample, and then adjust the slider to bring various parts of the specimen into focus.
Contributing Authors
Mortimer Abramowitz - Olympus America, Inc., Two Corporate Center Drive., Melville, New York, 11747.
Matthew J. Parry-Hill and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.
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Last modification: Tuesday, Jan 10, 2017 at 05:26 PM
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