Interactive Java Tutorials
Nikon Eclipse L200
Integrated Circuit Inspection
Examine integrated circuits in brightfield, darkfield, and differential interference contrast (DIC) reflected illumination with this interactive Java tutorial. Instructions for operation of the tutorial appear below the applet window.
When the tutorial initializes, a sample is randomly chosen from the pull-down menu and presented in the microscope port with the slider adjustments also randomly set. Use the Focus and Lamp Intensity sliders to adjust the image focus and brightness. Use the Magnification slider or the blue arrow buttons to increase or decrease the sample magnification. To view another sample, use the pull-down menu to select a new integrated circuit. Toggle between brightfield, darkfield, and DIC illumination with the radio buttons, which appear between the sliders and the pull-down menu.
Mortimer Abramowitz - Olympus America, Inc., Two Corporate Center Drive., Melville, New York, 11747.
Matthew J. Parry-Hill and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.
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