Integrated Circuit Inspection
Reflected Confocal Microscopy
Explore real-time confocal imaging of integrated circuits with reflected light confocal microscopy. Instructions for operation of the tutorial are given beneath the applet window.
This tutorial simulates imaging of integrated circuits using a Nikon Optiphot 200C IC Inspection Confocal Microscope. Use the Choose an Integrated Circuit pull-down menu to select a chip to image. Then use the Focus Depth slider to drop focus through the various focal planes visible through the microscope. Clicking on the blue arrow buttons to the left and right of the slider will toggle through the images in single order.
Mortimer Abramowitz - Olympus America, Inc., Two Corporate Center Drive., Melville, New York, 11747.
Matthew J. Parry-Hill and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.
BACK TO SPECIALIZED MICROSCOPY TECHNIQUES
BACK TO CONFOCAL MICROSCOPY
Questions or comments? Send us an email.
© 1995-2018 by
Michael W. Davidson
and The Florida State University.
All Rights Reserved. No images, graphics, software, scripts, or applets may be reproduced or used in any manner without permission from the copyright holders. Use of this website means you agree to all of the Legal Terms and Conditions set forth by the owners.
This website is maintained by our
Graphics & Web Programming Team
in collaboration with Optical Microscopy at the
National High Magnetic Field Laboratory.
Last modification: Friday, Feb 26, 2016 at 04:58 PM
Access Count Since April 25, 2000: 140720
For more information on microscope manufacturers,
use the buttons below to navigate to their websites: