Microscopy Primer
Light and Color
Microscope Basics
Special Techniques
Digital Imaging
Confocal Microscopy
Live-Cell Imaging
Photomicrography
Microscopy Museum
Virtual Microscopy
Fluorescence
Web Resources
License Info
Image Use
Custom Photos
Partners
Site Info
Contact Us
Publications
Home

The Galleries:

Photo Gallery
Silicon Zoo
Pharmaceuticals
Chip Shots
Phytochemicals
DNA Gallery
Microscapes
Vitamins
Amino Acids
Birthstones
Religion Collection
Pesticides
BeerShots
Cocktail Collection
Screen Savers
Win Wallpaper
Mac Wallpaper
Movie Gallery

Speckle Noise Reduction By Spatial Averaging

Most filter operations should be applied to the monochrome brightness rather than to the individual R, G, B color channels. That is not always the case for noise reduction filters, depending on whether the noise is different in the various channels (which in turn depends on where it originates and on the camera design). This interactive Java tutorial illustrates the effects of neighborhood averaging or Gaussian smoothing to random speckle noise.

Interactive Java Tutorial
ATTENTION
Our servers have detected that your web browser does not have the Java Virtual Machine installed or it is not functioning properly. Please install this software in order to view our interactive Java tutorials. You may download the necessary software by clicking on the "Get It Now" button below.

 

The tutorial initializes with a randomly selected specimen image appearing in the Specimen Image window. The Choose A Specimen pull-down menu provides a selection of specimen images, in addition to the initial randomly chosen one. For a color image, clicking either the Monochrome Noise or the Channel Noise radio buttons determines whether the noise is added independently to each channel to the brightness values only. The Speckle Noise Level slider controls the amount of noise that is added. The Choose A Convolution Kernel pull-down menu determines the type of filtering operation that will be performed on the specimen image. The result of the filtering operation appears in the Filtered Image window.

Contributing Authors

John C. Russ - Materials Science and Engineering Dept., North Carolina State University, Raleigh, North Carolina, 27695.

Matthew Parry-Hill, and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.


BACK TO INTRODUCTION TO DIGITAL IMAGE PROCESSING AND ANALYSIS

BACK TO MICROSCOPY PRIMER HOME

Questions or comments? Send us an email.
© 1998-2009 by Michael W. Davidson, John Russ, Olympus America Inc., and The Florida State University. All Rights Reserved. No images, graphics, scripts, or applets may be reproduced or used in any manner without permission from the copyright holders. Use of this website means you agree to all of the Legal Terms and Conditions set forth by the owners.
This website is maintained by our
Graphics & Web Programming Team
in collaboration with Optical Microscopy at the
National High Magnetic Field Laboratory.
Last modification: Wednesday, Mar 26, 2014 at 02:23 PM
Access Count Since July 20, 2006: 4103
For more information on microscope manufacturers,
use the buttons below to navigate to their websites: