Microscopy Primer
Light and Color
Microscope Basics
Special Techniques
Digital Imaging
Confocal Microscopy
Live-Cell Imaging
Photomicrography
Microscopy Museum
Virtual Microscopy
Fluorescence
Web Resources
License Info
Image Use
Custom Photos
Partners
Site Info
Contact Us
Publications
Home

The Galleries:

Photo Gallery
Silicon Zoo
Pharmaceuticals
Chip Shots
Phytochemicals
DNA Gallery
Microscapes
Vitamins
Amino Acids
Birthstones
Religion Collection
Pesticides
BeerShots
Cocktail Collection
Screen Savers
Win Wallpaper
Mac Wallpaper
Movie Gallery

Length Measurement

The length of structures can also be measured by a counting procedure. This interactive tutorial illustrates the measurement of length per unit volume, showing a transmission light microscope image of dendritic processes viewed in a section of known thickness. Measuring the length of the structures seen in the image would not take into account their three-dimensional wanderings up and down in the section. However, any grid lines drawn on the image represent surfaces that extend vertically downwards through the section, and counting the intersections made by the structures with those lines can provide a correct measurement of the total length per unit volume as shown in Equation 1.

The tutorial initializes with a dendritic specimen appearing in the Specimen Image window. The Original button shows the original grayscale image, and the Thresholded and Skeletonized button shows the dendritic structure after processing. The Line Grid shows the grid of lines used for measurement (cycloidal arcs in this example), and their total length. The Grid Overlay button shows the superposition of the grid lines on the structure. The Counting Hits button shows marks for each intersection of the grid lines with the structure, and the number of hits. The Grid Overlay button superimposes a line grid on the image and also displays the number of the times that the grid lines “hit” the boundary. Based on the equation, the calculated length of the structure is 0.071 µm per cubic µm.

Contributing Authors

John C. Russ - Materials Science and Engineering Dept., North Carolina State University, Raleigh, North Carolina, 27695.

Matthew Parry-Hill, and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.


BACK TO INTRODUCTION TO DIGITAL IMAGE PROCESSING AND ANALYSIS

BACK TO MICROSCOPY PRIMER HOME

Questions or comments? Send us an email.
© 1998-2009 by Michael W. Davidson, John Russ, Olympus America Inc., and The Florida State University. All Rights Reserved. No images, graphics, scripts, or applets may be reproduced or used in any manner without permission from the copyright holders. Use of this website means you agree to all of the Legal Terms and Conditions set forth by the owners.
This website is maintained by our
Graphics & Web Programming Team
in collaboration with Optical Microscopy at the
National High Magnetic Field Laboratory.
Last modification: Tuesday, Sep 11, 2018 at 02:42 PM
Access Count Since July 20, 2006: 7632
For more information on microscope manufacturers,
use the buttons below to navigate to their websites: